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动态高温反偏应力下的SiC MOSFET测试平台及其退化机理研究
左璐巍, 辛振, 蒙慧, 周泽, 余彬, 罗皓泽
动态高温反偏应力下的SiC MOSFET测试平台及其退化机理研究
Test Platform and Degradation Mechanism of SiC MOSFET under Dynamic High-temperature Reverse Bias Stress
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