IGBT模块栅氧老化机理分析与表征方法研究

魏伟伟，张杨，徐国卿

Research on Mechanism Analysis and Characterization Method for Gate Oxygen Degradation of IGBT Module

WEI Weiwei, ZHANG Yang, XU Guoqing

电源学报 . 2021, (6): 171 -178 . DOI: 10.13234/j.issn.2095-2805.2021.24.171