动态高温反偏应力下的SiC MOSFET测试平台及其退化机理研究
左璐巍, 辛振, 蒙慧, 周泽, 余彬, 罗皓泽
Test Platform and Degradation Mechanism of SiC MOSFET under Dynamic High-temperature Reverse Bias Stress
ZUO Luwei, XIN Zhen, MENG Hui, Student ZHOU Ze, YU Bin, LUO Haoze
电源学报
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2024, (3): 211
-219
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DOI: 10.13234/j.issn.2095-2805.2024.3.211
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