基于改进SqueezeNet算法的VBE设备电路板元件失效识别研究
刘隆晨, 杨玥坪, 贾志杰, 黄宇, 唐世雄, 谭博洋
Research on Component Failure Identification in VBE Device Circuit Boards Using Enhanced SqueezeNet Method
LIU Longchen, YANG Yueping, JIA Zhijie, HUANG Yu, TANG Shixiong, TAN Boyang
电源学报
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2024, (3): 236
-247
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DOI: 10.13234/j.issn.2095-2805.2024.3.236