漏源电压对SiC MOSFET阈值电压准确测量影响的研究
姚博均, 郭春生, 崔绍雄, 李嘉芃, 张亚民
Research on Influence of Drain-source Voltage on Accurate Measurement of SiC MOSFET Threshold Voltage
YAO Bojun, GUO Chunsheng, CUI Shaoxiong, LI Jiapeng, ZHANG Yamin
电源学报
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2024, (3): 258
-263
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DOI: 10.13234/j.issn.2095-2805.2024.3.258