高温栅偏和电子辐照对SiC MOSFET阈值电压影响研究
张子扬, 梁琳, 尚海, 盛轲焱, 黄江
Study on Influence of High-temperature Gate Bias and Electron Irradiation on Threshold Voltage of SiC MOSFET
ZHANG Ziyang, LIANG Lin, SHANG Hai, SHENG Keyan, HUANG Jiang
电源学报
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2024, (6): 288
-294
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DOI: 10.13234/j.issn.2095-2805.2024.6.288