Automatic Test and Control Strategy of Thermal Impedance Extraction of Power Semiconductor Devices

Automatic Test and Control Strategy of Thermal Impedance Extraction of Power Semiconductor Devices

LIU Bo, ZHU Ye, YANG Yunxiao, MA Ke

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Journal of Power Supply ›› 2021, Vol. 19 ›› Issue (5) : 150-157. DOI: 10.13234/j.issn.2095-2805.2021.5.150

SiC， GaN Device, New Power Device and Its Applications

Automatic Test and Control Strategy of Thermal Impedance Extraction of Power Semiconductor Devices

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2021, 19(5): 150-157 https://doi.org/10.13234/j.issn.2095-2805.2021.5.150

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