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Investigation on Reliability of High-temperature Gate Oxide in SiC MOSFET
LIU Jianjun, CHEN Hong, DING Jieqin, BAI Yun, HAO Jilong, HAN Zhonglin
Journal of Power Supply . 2024, (
1
): 147 -152 . DOI: 10.13234/j.issn.2095-2805.2024.1.147
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