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Review on Gate Oxide Reliability of SiC MOSFET Devices
HU Jiahao, WANG Yinglun, DAI Haohao, DENG Xiaochuan, ZHANG Bo
Journal of Power Supply . 2024, (
4
): 1 -11 . DOI: 10.13234/j.issn.2095-2805.2024.4.1
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