Study on Influence of High-temperature Gate Bias and Electron Irradiation on Threshold Voltage of SiC MOSFET
ZHANG Ziyang, LIANG Lin, SHANG Hai, SHENG Keyan, HUANG Jiang
Journal of Power Supply . 2024, (6): 288 -294 .  DOI: 10.13234/j.issn.2095-2805.2024.6.288

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